Author(s):
1. Dragoljub Mirjanić, Akademija nauka i umjetnosti Republike Srpske, Republic of Srpska, Bosnia and Herzegovina
2. Tomislav Pavlović, University of Nis, Faculty of Sciences and Mathematics, , Serbia
3. Esad Jakupovic, Republic of Srpska, Bosnia and Herzegovina
4. Darko Divnić, Akademija nauka i umjetnosti Republike Srpske, Republic of Srpska, Bosnia and Herzegovina

Abstract:
This paper will analyze the characterization methods of materials used in solar energy. When electrons enter the specimen,the electrons are scattered within the specimen and gradually lose their energy,then they are absorbed in the specimen.The scattering range of the electrons inside the specimen is different depending on the electron energy,the atomic number of the elements making up the specimen and the density of the constituent atoms.Scanning electron microscopy(SEM)operation is based on the bombardment of the sample by the electrons of a specific energy and a detection of the secondary electrons,which are thereby emitted from the sample.Testing of materials using electron microprobe (EMP)consists of the bombing of the sample by a beam of electrons and analyzing the emitted X-rays from the sample.Auger electron spectroscopy(AES)is based on the Auger processes in which,under the influence of an external electron beam,the emission of Auger electrons occurs in the material.The measure the emissivity of the photo conversion materials,emissometers are used.This emissometer consists of probes,heatstabilizer and digital voltmeter.Practical work with ellipsometry is performed by illuminating the sample by sample by elliptically polarized laser beam and detection of linear polarized light that is reflected from the sample.

Key words:
Secondary,backscattered and Auger electrons,SEM,electron microprobe,Elipsometer

Thematic field:
SYMPOSIUM A - Science of matter, condensed matter and physics of solid states

Date of abstract submission:
02.08.2019.

Conference:
Contemporary Materials 2019 - Savremeni Materijali